Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
MD&M East

FDA Releases Draft Guidance on De Novo Classification Process

FDA has issued draft guidance on the de novo device classification process, indicating that the agency will allow manufacturers to submit devices for de novo classification at the same time as they ...
International Paralympic Committee

New IPC Classification Code made available ahead of Extraordinary General Assembly

Following a three-year open consultation process that engaged 80 per cent of its membership, as well as the athlete community, the International Paralympic Committee (IPC) has published the final ...